JEM-ARM200F是一台具有亚埃分辨率的扫描透射电子显微镜,配备有电子束球差校正系统、X-射线能谱仪和电子能量损失谱仪。可同时进行原子分辨率的成像和化学份分析。
扫描透射模式分辨率:暗场像 0.08 nm 明场像 0.14 nm
透射模式分辨率:点分辨率 0.19 nm 信息分辨率 0.10 nm
放大倍率:扫描透射模式 100 to 150,000,000X 透射模式 50 to 2,000,000X
光斑尺寸:最小直径0.10nm
代表性支撑论文:
1. Zixiong Sun, Chunrui Ma, Ming Liu, Jin Cui, Lu Lu, Jiangbo Lu, Xiaojie Lou, Lei Jin, Hong Wang, Chun-Lin Jia. "Ultrahigh energy storage performance of lead-free Oxide multilayer film capacitors via interface engineering". Advanced Materials, 29: 1604427, 2017.
2. Shao-Bo Mi, Ru-Yi Zhang, Lu Lu, Ming Liu, Hong Wang, Chun-Lin Jia. "Atomic-scale structure and formation of antiphase boundaries in α-Li0.5Fe2.5O4 thin films on MgAl2O4(001) substrates". Acta Materialia, 127: 178-184, 2017.
3. Hong-Mei Jing, Guang-Liang Hu, Shao-Bo Mi, Lu Lu, Ming Liu, Shao-Dong Cheng, Sheng Cheng, Chun-Lin Jia. "Microstructure and electrical conductivity of (Y, Sr)CoO3-δ thin films tuned by the film-growth temperature". Journal of Alloys and Compounds, 714: 181-185, 2017.
4. Chao Li, Lingyan Wang, Zhao Wang, Yaodong Yang, Wei Ren, Guang Yang. "Atomic resolution interfacial structure of lead-free ferroelectric K0.5Na0.5NbO3 thin films deposited on SrTiO3". Scientific Reports, 6: 37788, 2016.
5. Xiao-Wei Jin, Lu Lu, Shao-Bo Mi, Ming Liu, Chun-Lin Jia, "Phase stability and B-site ordering in La2NiMnO6 thin films". Applied Physics Letters, 109: 031904, 2016.
6. Linglong Li, Lu Lu, Dawei Zhang, Ran Su, Guang Yang, Junyi Zhai, Yaodong Yang, "Direct Observation of Magnetic Field Induced Ferroelectric Domain Evolution in Self-Assembled Quasi (0-3) BiFeO3–CoFe2O4 Thin Films". ACS Applied Materials &Interfaces, 8: 442–448, 2016.
7. Xianfeng Du, Qianwen Wang, Tianyu Feng, Xizi Chen, Liang Li, Long Li, Xiangfei Meng, Lilong Xiong, Xiaofei Sun, Lu Lu, Youlong Xu. "One-step preparation of nanoarchitectured TiO2 on porous Al as integrated anode for high-performance lithium-ion batteries". Scientific Reports, 6: 20138, 2016.
8. Shaodong Cheng, Guang Yang, Yanqi Zhao, Mingying Peng, Jorgen Skibsted, Yuanzheng Yue, "Quantification of the boron speciation in alkali borosilicate glasses by electron energy loss spectroscopy". Scientific Reports, 5: 17526, 2015.
9. S. B. Mi, C. L. Jia, L. Vrejoiu, M. Alexe, and D. Hesse, "Atomic-Scale Structure and Properties of Epitaxial PbZr0.2Ti0.8O3/SrRuO3 Heterointerfaces", Advanced Materials Interfaces, 2: 1500087, 2015.