JEM - ARM200F is a high-resolution scanning transmission electron microscope (STEM), which is equipped with a Cs-corrector in the condenser lens system. This instrument is also equipped with x-ray and electron energy loss spectroscopy systems (EDS and EELS).

Application

1. LIB note

2. High Resolution Imaging and Spectroscopy

3. Study of Nanoparticles at UTSA: One Year of Using the First JEM-ARM200F Installed in USA

4. Atomic-Resolution Elemental Mapping by EELS in Aberration Corrected STEM

5. Ultrahigh-Resolution STEM Analysis of Complex Compounds