受我工作室贾春林教授邀请， 德国Christian-Albrechts-University Kiel的wolfgang Jäger教授将于2017年10月11日上午在新材料大楼材料学院第一会议室讲座，题为“Advanced Transmission Electron Microscopy of Functional Nanomaterials”。欢迎各位老师同学的参加！

邀请讲座人：Wolfgang Jäger

简介：Prof. Dr. Wolfgang Jäger has been a staff scientist at Research Center Jülich, Germany from 1979 to 1987, and became a full professor at CAU Kiel since 1996. Currently, he is formally retired from teaching duties, but is still very active on research. His research interests include microstructure of materials and electron microscopy study of functional materials etc. Wolfgang Jäger once served as head of ‘AG Mikrostrukturanalytik’ / ‘Microanalysis of Materials Group’ and 'CMA Center for Materials Analysis’ at CAU Kiel. He carried out interdisciplinary focus project ‘Nanoanalytics with electrons for materials science and surface science’ and developed interdisciplinary CAU Laboratory for Analytical TEM, thus worked as director of the Institute for Materials Science. He has written more than 300 scientific publications, including publications in scientific journals, review articles, book articles and conference publications. Numerous invited and plenary presentations have been done at international conferences, in advanced scientific schools and institutes. He also offers cooperation and technology transfer with research institutions and industry in the fields of ‘materials analyses by methods of electron microscopy and further methods for the microanalysis of materials’ and ‘R & D projects in research and development for materials and devices’.

【报告题目】Advanced Transmission Electron Microscopy of Functional Nanomaterials

时间:  10:10-12:00 am, Oct.11st,2017

地点:  新材料大楼材料学院第一会议室

摘要：High-resolution imaging and spectroscopic techniques of advanced transmission electron microscopy (TEM) play a crucial role in characterizing the structure-property relationships of inorganic functional materials and interfaces. The microstructure, the elemental composition, and physical properties of nanomaterials can be characterized quantitatively and with resolutions in the nanometer regime or even on the atomic level. After a brief introduction to the nanoanalytical methods of TEM, illustrated by examples of ultrathin layer and nanoparticle characteriaztions, the presentation summarizes recent applications to investigations of surface and interface phenomena of TMDC layered crystals, of nanostructured oxide semiconductors4-6, of multilayer systems for X-ray optics, and of strain and interface engineering for the fabrication of high-efficiency solar cells. 

握手学术前沿，探究异域风情，材料学人在此齐聚，怎能没有你？

讲座可盖章！